Clément
MOREAU
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Bâtiment CISIT
Revue internationale avec comité de lecture
Moreau C., Bigerelle M., Marteau J., Lemesle J., Paez margarit D., Guibert R., Blateyron F., Brown C. (2024). A novel methodology to assess optical profilometer stability to discriminate surface roughness. Surface Topography: Metrology and Properties, 12 [DOI=10.1088/2051-672X/ad4378].
Moreau C., Lemesle J., Paez margarit D., Blateyron F., Bigerelle M. (2024). Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps. Metrology, 141-163, pp. 4(2) [DOI=https://doi.org/10.3390/metrology4020010].
Lemesle J., Moreau C., Deltombe R., Martin J., Blateyron F., Bigerelle M., Brown C. (2023). Height Fluctuations and Surface Gradients in Topographic Measurements. Materials, 16, pp. 5408 [DOI=https://doi.org/10.3390/ma16155408].
Lemesle J., Moreau C., Deltombe R., Blateyron F., Martin J., Bigerelle M., Brown C. (2023). Top-down determination of fluctuations in Topographic measurements. Materials, 16(2), pp. 473 [DOI=https://doi.org/10.3390/ma16020473].